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Proceedings Paper

Measurement of x-ray spectra using a recent YAP(Ce)-MPPC detector
Author(s): Eiichi Sato; Yasuyuki Oda; Sohei Yoshida; Satoshi Yamaguchi; Yuichi Sato; Tomotaka Ishii; Osahiko Hagiwara; Hiroshi Matsukiyo; Toshiyuki Enomoto; Manabu Watanabe; Shinya Kusachi
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Paper Abstract

To measure X-ray spectra with high count rates, we developed a detector consisting of a cerium-doped yttrium aluminum perovskite [YAP(Ce)] crystal and a recent multipixel photon counter (MPPC). Scintillation photons are detected using the MPPC, and the photocurrents flowing through the MPPC are converted into voltages and amplified using a high-speed current-voltage (I-V) amplifier. The MPPC bias voltage was set to a value at the pre-Geiger mode to perform zero-dark counting. The event-pulse widths were approximately 200 ns, and the widths were extend to approximately 1 μs. X-ray spectra were measured using a multichannel analyzer (MCA) for pulse-height analysis. The photon energy was roughly determined by the two-point calibration using tungsten K photons and iodine K fluorescence. Using the YAP(Ce)-MPPC detector, first-generation dual-energy computed tomography was accomplished using iodine and gadolinium contrast media.

Paper Details

Date Published: 7 September 2017
PDF: 6 pages
Proc. SPIE 10393, Radiation Detectors in Medicine, Industry, and National Security XVIII, 103930J (7 September 2017); doi: 10.1117/12.2275288
Show Author Affiliations
Eiichi Sato, Iwate Medical Univ. (Japan)
Yasuyuki Oda, Iwate Medical Univ. (Japan)
Sohei Yoshida, Iwate Medical Univ. (Japan)
Satoshi Yamaguchi, Iwate Medical Univ. (Japan)
Yuichi Sato, Iwate Medical Univ. Hospital (Japan)
Tomotaka Ishii, Toho Univ. (Japan)
Osahiko Hagiwara, Toho Univ. (Japan)
Hiroshi Matsukiyo, Toho Univ. (Japan)
Toshiyuki Enomoto, Toho Univ. (Japan)
Manabu Watanabe, Toho Univ. (Japan)
Shinya Kusachi, Toho Univ. (Japan)


Published in SPIE Proceedings Vol. 10393:
Radiation Detectors in Medicine, Industry, and National Security XVIII
Gary P. Grim; Lars R. Furenlid; H. Bradford Barber, Editor(s)

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