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Comparison of higher irradiance and black panel temperature UV backsheet exposures to field performance
Author(s): Thomas C. Felder; William J. Gambogi; Nancy Phillips; Steven W. MacMaster; Bao-Ling Yu; T. John Trout
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Paper Abstract

The need for faster PV qualification tests that more accurately match field observations is leading to tests with higher acceleration levels, and validating the new tests through comparison to field data is an important step. We have tested and compared a wide panel of backsheets according to a proposed new backsheet UV exposure qualification standard from the International Electrotechnical Commission (IEC). Weathering Technical Standard IEC 62788-7-2 specifies higher irradiance and higher black panel temperature UV Xenon exposures. We tested PVF, PVDF, PET, PA and FEVEbased backsheets in glass laminates and simple backsheet coupons in UV exposure condition A3 (0.8W/sqmnm@340nm and 90° C BPT) We find mild yellowing with no mechanical loss in the original lower intensity ASTM G155 0.55 W/sqm-nm 70C BPT exposure condition. The new A3 exposures creates mechanical loss in sensitive backsheets, with no effect on known durable backsheets. Results from the new exposure are closer to field mechanical loss data.

Paper Details

Date Published: 23 August 2017
PDF: 7 pages
Proc. SPIE 10370, Reliability of Photovoltaic Cells, Modules, Components, and Systems X, 1037002 (23 August 2017); doi: 10.1117/12.2275284
Show Author Affiliations
Thomas C. Felder, E. I. du Pont de Nemours and Co. (United States)
William J. Gambogi, E. I. du Pont de Nemours and Co. (United States)
Nancy Phillips, E. I. du Pont de Nemours and Co. (United States)
Steven W. MacMaster, E. I. du Pont de Nemours and Co. (United States)
Bao-Ling Yu, E. I. du Pont de Nemours and Co. (United States)
T. John Trout, E. I. du Pont de Nemours and Co. (United States)


Published in SPIE Proceedings Vol. 10370:
Reliability of Photovoltaic Cells, Modules, Components, and Systems X
Neelkanth G. Dhere; Keiichiro Sakurai; Michael D. Kempe, Editor(s)

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