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Proceedings Paper

Non-degenerate two-photon excitation for increasing the fluorescence photon yield and maximum microscopy imaging depth (Conference Presentation)
Author(s): Mu-Han Yang; Christopher G. L. Ferri; Payam A. Saisan; Maxim Abashin; Peifang Tian; Yeshayahu Fainman; Anna Devor
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Paper Abstract

We investigate the utility of non-degenerate 2-photon excitation (ND-2PE) as a strategy for extending the 2-photon imaging depth. For the ND-2PE scheme, two pulsed, synchronized laser sources of different wavelength each provide a photon for the 2-photon absorption process. By independently tuning their wavelengths, we are able to tune the excitation to tissue transparency windows while maintaining resonant fluorescence excitation. These transparency windows reduce excitation power loss resulting from scattering. In addition, by having two sources we are able to displace the beams in space except at their common focus; thus, reducing background fluorescence excitation. Finally, we show that ND-2PE inherently results in increased 2-photon absorption cross sections, resulting in increased fluorescence intensity. By combining beam displacement, tissue transparency and increased absorption cross sections, we achieve increased imaging depths as compared to degenerate 2-photon excitation with commonly used fluorophores.

Paper Details

Date Published: 19 September 2017
Proc. SPIE 10380, Ultrafast Nonlinear Imaging and Spectroscopy V, 103800Y (19 September 2017); doi: 10.1117/12.2274849
Show Author Affiliations
Mu-Han Yang, Univ. of California, San Diego (United States)
Christopher G. L. Ferri, Univ. of California, San Diego (United States)
Payam A. Saisan, Univ. of California, San Diego (United States)
Maxim Abashin, Univ. of California, San Diego (United States)
Peifang Tian, John Carroll Univ. (United States)
Yeshayahu Fainman, Univ. of California, San Diego (United States)
Anna Devor, Univ. of California, San Diego (United States)

Published in SPIE Proceedings Vol. 10380:
Ultrafast Nonlinear Imaging and Spectroscopy V
Zhiwen Liu, Editor(s)

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