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Proceedings Paper

Nano-focused hard x-ray beam measured by ptychography (Conference Presentation)
Author(s): Xiaojing Huang; Hanfei Yan; Evgeny Nazaretski; Mingyuan Ge; Nathalie Bouet; Juan Zhou; Weihe Xu; Petr P. Ilinski; Yong S. Chu

Paper Abstract

With the progress of achieving diffraction-limited X-ray focus, ptychography offers a unique and powerful tool to provide quantitative reconstruction of the complex-valued wavefront of a focused beam. Propagation of the reconstructed wavefront essentially describes complete performance characterization of the optics. We will present the accumulated efforts at NSLS-II on exploring the capability of ptychography to quantify focusing performance of a variety of hard X-ray optics, including K-B mirrors, zone plates, multilayer Laue lenses [1-3]. Presentation will also elaborate on our recent development of monolithically bonded MLLs as a signal optical component for scanning probe microscope applications [4,5]. References: [1] X. Huang, et al., “Quantitative X-ray wavefront measurements of Fresnel zone plate and K-B mirrors using phase retrieval”, Optics Express, 20, 24038-24048 (2012). [2] X. Huang, et al., “11 nm hard X-ray focus from a large-aperture multilayer Laue lens”, Scientific Reports, 3, 3562 (2013). [3] X. Huang, et al., “Achieving hard X-ray nanofocusing using a wedged multilayer Laue lens”, Optics Express, 23, 12496-12507 (2015). [4] E. Nazaretski, et al., “Development and characterization of monolithic multilayer Laue lens nanofocusing optics"”, Applied Physics Letters, 108, 261102 (2016). [5] X. Huang, et al., “Hard x-ray scanning imaging achieved with bonded multilayer Laue lenses”, submitted, (2017).

Paper Details

Date Published: 25 September 2017
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Proc. SPIE 10388, Advances in Computational Methods for X-Ray Optics IV, 103880O (25 September 2017); doi: 10.1117/12.2274832
Show Author Affiliations
Xiaojing Huang, Brookhaven National Lab. (United States)
Hanfei Yan, Brookhaven National Lab. (United States)
Evgeny Nazaretski, Brookhaven National Lab. (United States)
Mingyuan Ge, Brookhaven National Lab. (United States)
Nathalie Bouet, Brookhaven National Lab. (United States)
Juan Zhou, Brookhaven National Lab. (United States)
Weihe Xu, Brookhaven National Lab. (United States)
Petr P. Ilinski, Brookhaven National Lab. (United States)
Yong S. Chu, Brookhaven National Lab. (United States)


Published in SPIE Proceedings Vol. 10388:
Advances in Computational Methods for X-Ray Optics IV
Oleg Chubar; Kawal Sawhney, Editor(s)

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