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Authentication Sensing System Using Resonance Evaluation Spectroscopy (ASSURES)
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Paper Abstract

This paper describes an ongoing instrument development project to distinguish genuine manufactured components from counterfeit components; we call the instrument ASSURES (Authentication Sensing System Using Resonance Evaluation Spectroscopy). The system combines Laser Doppler Vibrometry with acoustical resonance spectroscopy, augmented with finite element analysis. Vibrational properties of components, such as resonant modes, damping, and spectral frequency response to various forcing functions depend strongly upon the mechanical properties of the material, including its size, shape, internal hardness, tensile strength, alloy/composite compositions, flaws, defects, and other internal material properties. Although acoustic resonant spectroscopy has seen limited application, the information rich signals in the vibrational spectra of objects provide a pathway to many new applications. Components with the same shape but made of different materials, different fatigue histories, damage, tampering, or heat treatment, will respond differently to high frequency stimulation. Laser Doppler Vibrometry offers high sensitivity and frequency bandwidth to measure the component’s frequency spectrum, and overcomes many issues that limit conventional acoustical resonance spectroscopy, since the sensor laser beam can be aimed anywhere along the part as well as to multiple locations on a part in a non-contact way. ASSURES is especially promising for use in additive manufacturing technology by providing signatures as digital codes that are unique to specific objects and even to specific locations on objects. We believe that such signatures can be employed to address many important issues in the manufacturing industry. These include insuring the part meets the often very rigid specifications of the customer and being able to detect non-visible internal manufacturing defects or non-visible damage that has occurred after manufacturing.

Paper Details

Date Published: 23 August 2017
PDF: 9 pages
Proc. SPIE 10373, Applied Optical Metrology II, 103730D (23 August 2017); doi: 10.1117/12.2274831
Show Author Affiliations
James D. Trolinger, MetroLaser, Inc. (United States)
Andrei K. Dioumaev, MetroLaser, Inc. (United States)
Amit K. Lal, Optical Measurement Systems Corp. (United States)
Dave Dimas, Univ. of California, Irvine (United States)


Published in SPIE Proceedings Vol. 10373:
Applied Optical Metrology II
Erik Novak; James D. Trolinger, Editor(s)

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