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Micromirror-based manipulation of synchrotron x-ray beams
Author(s): D. A. Walko; Pice Chen; I. W. Jung; D. Lopez; C. P. Schwartz; G. K. Shenoy; Jin Wang
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Paper Abstract

Synchrotron beamlines typically use macroscopic, quasi-static optics to manipulate x-ray beams. We present the use of dynamic microelectromechanical systems-based optics (MEMS) to temporally modulate synchrotron x-ray beams. We demonstrate this concept using single-crystal torsional MEMS micromirrors oscillating at frequencies of 75 kHz. Such a MEMS micromirror, with lateral dimensions of a few hundred micrometers, can interact with x rays by operating in grazing-incidence reflection geometry; x rays are deflected only when an x-ray pulse is incident on the rotating micromirror under appropriate conditions, i.e., at an angle less than the critical angle for reflectivity. The time window for such deflections depends on the frequency and amplitude of the MEMS rotation. We demonstrate that reflection geometry can produce a time window of a few microseconds. We further demonstrate that MEMS optics can isolate x rays from a selected synchrotron bunch or group of bunches. With ray-trace simulations we explain the currently achievable time windows and suggest a path toward improvements.

Paper Details

Date Published: 23 August 2017
PDF: 8 pages
Proc. SPIE 10386, Advances in X-Ray/EUV Optics and Components XII, 103860Z (23 August 2017); doi: 10.1117/12.2274422
Show Author Affiliations
D. A. Walko, Argonne National Lab. (United States)
Pice Chen, Argonne National Lab. (United States)
I. W. Jung, Argonne National Lab. (United States)
D. Lopez, Argonne National Lab. (United States)
C. P. Schwartz, Argonne National Lab. (United States)
G. K. Shenoy, Argonne National Lab. (United States)
Jin Wang, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 10386:
Advances in X-Ray/EUV Optics and Components XII
Christian Morawe; Ali M. Khounsary; Shunji Goto, Editor(s)

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