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Proceedings Paper

High-resolution spectroscopy and imaging of interfacial strain fields in InN/GaN and GaN/InN/GaN heterostructures
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Proc. SPIE 10378, Sixteenth International Conference on Solid State Lighting and LED-based Illumination Systems, 103780C; doi: 10.1117/12.2274350
Show Author Affiliations
Yohannes Abate, Georgia State Univ. (United States)
Alireza Fali, Georgia State Univ. (United States)
Viktoriia E. Babicheva, Georgia State Univ. (United States)
Nikolaus Dietz, Georgia State Univ. (United States)


Published in SPIE Proceedings Vol. 10378:
Sixteenth International Conference on Solid State Lighting and LED-based Illumination Systems
Nikolaus Dietz; Ian T. Ferguson, Editor(s)

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