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Proceedings Paper

Model development of degradation of PV modules backsheet with locating place of module
Author(s): Yu Wang; Andrew Fairbrother; Sebastien Merzlic; Scott Julien; Lucas S. Fridman; Camille Loyer; Amy L. Lefebvre; Gregory O'Brien; Xiaohong Gu; Liang Ji; Kenneth P. Boyce; Michael Kempe; Kai-tak Wan; Roger H. French; Laura S. Bruckman
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Paper Abstract

Performance of a photovoltaic (PV) module is related to the micro-environment around the module. The position of photovoltaic modules in an array row have a large effect on the yellowing and gloss of PV module backsheet exposed in Dfa climatic zone (Gaithersburg, MD) with a polyethylene naphthalate (PEN) outer layer. <Stress/ Response< models of yellowing and gloss-losing as function of location parameters of module, including the shed, row, measurement position in a same module and the distance of module location to the row center, are under development. The module installation height had the greatest influence on degradation of PEN PV backsheet in the Dfa climatic zone. The module backsheets at the end of an array have higher degradation rate (edge effect). The edge effect decreases with increasing of module installation heights.

Paper Details

Date Published: 23 August 2017
PDF: 10 pages
Proc. SPIE 10370, Reliability of Photovoltaic Cells, Modules, Components, and Systems X, 103700L (23 August 2017); doi: 10.1117/12.2274209
Show Author Affiliations
Yu Wang, Case Western Reserve Univ. (United States)
Andrew Fairbrother, National Institute of Standards and Technology (United States)
Sebastien Merzlic, Arkema, Inc. (United States)
Scott Julien, Northeastern Univ. (United States)
Lucas S. Fridman, Case Western Reserve Univ. (United States)
Camille Loyer, Arkema, Inc. (United States)
Amy L. Lefebvre, Arkema, Inc. (United States)
Gregory O'Brien, Arkema, Inc. (United States)
Xiaohong Gu, National Institute of Standards and Technology (United States)
Liang Ji, Underwriters Labs. Inc. (United States)
Kenneth P. Boyce, Underwriters Labs. Inc. (United States)
Michael Kempe, National Renewable Energy Lab. (United States)
Kai-tak Wan, Northeastern Univ. (United States)
Roger H. French, Case Western Reserve Univ. (United States)
Laura S. Bruckman, Case Western Reserve Univ. (United States)


Published in SPIE Proceedings Vol. 10370:
Reliability of Photovoltaic Cells, Modules, Components, and Systems X
Neelkanth G. Dhere; Keiichiro Sakurai; Michael D. Kempe, Editor(s)

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