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Proceedings Paper

Laboratory progress in soft x-ray polarimetry
Author(s): Sarah N. T. Heine; Herman L. Marshall; Ralf K. Heilmann; Norbert S. Schulz; Kyle Beeks; Francesco Drake; Derek Gaines; Skylar Levey; David L. Windt; Eric M. Gullikson
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Paper Abstract

We present continued development of components for measuring linear X-ray polarization over the 0.2-0.8 keV (15-62 Angstrom) band. We present results from measurements of new laterally graded multilayer mirrors and critical angle transmission gratings essential to the approach. While the lab is designed to verify components to be used in a soft X-ray polarimeter, it is reconfigurable and has been used to verify grating efficiencies with our new CCD detector. Our development work is the basis for a sounding rocket mission (Rocket Experiment Demonstration of a Soft X-ray Polarimeter) and future orbital missions.

Paper Details

Date Published: 29 August 2017
PDF: 8 pages
Proc. SPIE 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII, 1039916 (29 August 2017); doi: 10.1117/12.2274205
Show Author Affiliations
Sarah N. T. Heine, Massachusetts Institute of Technology (United States)
Herman L. Marshall, Massachusetts Institute of Technology (United States)
Ralf K. Heilmann, Massachusetts Institute of Technology (United States)
Norbert S. Schulz, Massachusetts Institute of Technology (United States)
Kyle Beeks, Massachusetts Institute of Technology (United States)
Francesco Drake, Univ. of Massachusetts Amherst (United States)
Derek Gaines, Univ. of Massachusetts Amherst (United States)
Skylar Levey, Connecticut College (United States)
David L. Windt, Reflective X-Ray Optics LLC (United States)
Eric M. Gullikson, Lawrence Berkeley National Lab. (United States)


Published in SPIE Proceedings Vol. 10399:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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