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Proceedings Paper

On optical-absorption peaks in a nonhomogeneous dielectric material over a two-dimensional metallic surface-relief grating
Author(s): Faiz Ahmad; Tom H. Anderson; Benjamin J. Civiletti; Peter B. Monk; Akhlesh Lakhtakia
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Paper Abstract

The rigorous coupled-wave approach (RCWA) was used to calculate the optical absorption in a dielectric material deposited over a two-dimensional (2D) metallic surface-relief grating. The dielectric material was taken to be nonhomogeneous in the direction normal to the mean plane of the grating. The grating was chosen to comprise hillocks on a square grid. On illumination by a monochromatic plane waves, the chosen structure should support the excitation of two types of guided-wave modes: surface-plasmon-polariton (SPP) waves and waveguide modes (WGMs). Two cases were considered: (i) a 1D photonic crystal made from layers of silicon oxynitrides of differing composition, and (ii) a tandem solar cell comprising three amorphous-silicon p-i-n junctions. Optical absorption was studied in relation to the direction of propagation, polarization state, and the free-space wavelength of the incident plane wave. Several but not all absorptance peaks were correlated with the excitations of SPP-wave modes and WGMs predicted by the solutions of the underlying canonical boundary-value problems for guided-wave propagation. Some peaks of useful absorptances in the solar cell were also predicted by solutions of the canonical problems.

Paper Details

Date Published: 30 August 2017
PDF: 20 pages
Proc. SPIE 10356, Nanostructured Thin Films X, 103560I (30 August 2017); doi: 10.1117/12.2274142
Show Author Affiliations
Faiz Ahmad, The Pennsylvania State Univ. (United States)
Tom H. Anderson, Univ. of Delaware (United States)
Benjamin J. Civiletti, Univ. of Delaware (United States)
Peter B. Monk, Univ. of Delaware (United States)
Akhlesh Lakhtakia, The Pennsylvania State Univ. (United States)


Published in SPIE Proceedings Vol. 10356:
Nanostructured Thin Films X
Yi-Jun Jen; Akhlesh Lakhtakia; Tom G. Mackay, Editor(s)

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