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Proceedings Paper

Analyzing the degradation of pre-damaged PV-modules
Author(s): Claudia Buerhop; Thilo Winkler; Sven Wirsching; Tobias Pickel; Andreas Bemm; Christian Camus; Jens Hauch; Christoph J. Brabec
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Paper Abstract

Cracked PV-modules are frequently detected in PV-systems. The impact of cracked cells on the energy yield and module performance under real operating conditions is not yet understood but of great relevance. Standard tests cannot reveal the relevant information conclusively. Therefore, we conducted a twofold analysis. 1) field exposure (global analysis on string level as well as detailed analysis on module level), and 2) load testing in the lab. Here, we present comparative electroluminescence (EL-) images recorded in an outdoor test stand and during load testing. Additionally, infrared (IR-) images as well as power data obtained from loaded and operating (field) conditions are discussed.

Paper Details

Date Published: 23 August 2017
PDF: 12 pages
Proc. SPIE 10370, Reliability of Photovoltaic Cells, Modules, Components, and Systems X, 103700H (23 August 2017); doi: 10.1117/12.2273978
Show Author Affiliations
Claudia Buerhop, Bayerisches Zentrum für Angewandte Energieforschung e.V. (Germany)
Thilo Winkler, Bayerisches Zentrum für Angewandte Energieforschung e.V. (Germany)
Sven Wirsching, Bayerisches Zentrum für Angewandte Energieforschung e.V. (Germany)
Tobias Pickel, Bayerisches Zentrum für Angewandte Energieforschung e.V. (Germany)
Andreas Bemm, Allianz Risk Consulting GmbH, AZT (Germany)
Christian Camus, Bayerisches Zentrum für Angewandte Energieforschung e.V. (Germany)
Jens Hauch, Bayerisches Zentrum für Angewandte Energieforschung e.V. (Germany)
Christoph J. Brabec, Bayerisches Zentrum für Angewandte Energieforschung e.V. (Germany)
i-MEET (Germany)


Published in SPIE Proceedings Vol. 10370:
Reliability of Photovoltaic Cells, Modules, Components, and Systems X
Neelkanth G. Dhere; Keiichiro Sakurai; Michael D. Kempe, Editor(s)

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