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Proceedings Paper

Progress on the fabrication of lightweight single-crystal silicon x-ray mirrors
Author(s): Raul E. Riveros; Michael P. Biskach; Kim D. Allgood; John D. Kearney; Michal Hlinka; William W. Zhang
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Paper Abstract

Single crystal silicon is an excellent X-ray mirror substrate material due to its high stiffness, low density, high thermal conductivity, zero internal stress, and commercial availability. At NASA Goddard Space Flight Center, we have been developing a process for producing high resolution and lightweight X-ray mirror segments at low cost and with high throughput. Previously we demonstrated the possibility of producing X-ray mirrors which meet the high demands of a future X-ray mission. Presently, we are producing lightweight X-ray mirror segments of unprecedented quality. This paper presents results from these recent investigations.

Paper Details

Date Published: 29 August 2017
PDF: 6 pages
Proc. SPIE 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII, 103990T (29 August 2017); doi: 10.1117/12.2273918
Show Author Affiliations
Raul E. Riveros, NASA Goddard Space Flight Ctr. (United States)
Univ. of Maryland, Baltimore County (United States)
Ctr. for Research and Exploration in Space Science and Technology (United States)
Michael P. Biskach, NASA Goddard Space Flight Ctr. (United States)
Stinger Ghaffarian Technologies, Inc. (United States)
Kim D. Allgood, NASA Goddard Space Flight Ctr. (United States)
Stinger Ghaffarian Technologies, Inc. (United States)
John D. Kearney, NASA Goddard Space Flight Ctr. (United States)
Stinger Ghaffarian Technologies, Inc. (United States)
Michal Hlinka, NASA Goddard Space Flight Ctr. (United States)
Stinger Ghaffarian Technologies, Inc. (United States)
William W. Zhang, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 10399:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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