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Proceedings Paper

An angular-resolution booster on the broadband X-ray telescope system
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Paper Abstract

We present a design of the broad band telescope with the angular resolution booster. A concept of the Xray imaging system with high angular-resolution and moderate sensitivity was presented by Maeda et al. (submitted). In the concept, a two-dimensional detector, i.e., imager, is put at a slightly defocused position of the focusing mirror, rather than right at the mirror focus as in the standard optics. The detector at the off-focus captures the microcosm of front mask-slits that are placed on the front of the mirror. The masks work as a modulation collimator and boost the angular resolution of the focusing telescope. The major advantage of this concept is that a much better angular resolution by an order of 2–3 or more than in the conventional optics is achievable, while a high throughput (large effective area) is maintained. We therefore present an example of a booster for a broad-band telescope. Using the technique of the Pt/C depth-graded supermirror, the broadband coverage up to 80 keV is discussed.

Paper Details

Date Published: 29 August 2017
PDF: 9 pages
Proc. SPIE 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII, 103991R (29 August 2017); doi: 10.1117/12.2273466
Show Author Affiliations
Yoshitomo Maeda, Institute of Space and Astronautical Science (Japan)
Japan Aerospace Exploration Agency (Japan)
The Graduate Univ. for Advanced Studies (Japan)
Ryo Iizuka, Institute of Space and Astronautical Science (Japan)
Japan Aerospace Exploration Agency (Japan)
Toshiki Sato, Tokyo Metropolitan Univ. (Japan)
Manabu Ishida, Institute of Space and Astronautical Science (Japan)
Japan Aerospace Exploration Agency (Japan)
The Graduate Univ. for Advanced Studies (Japan)
Takayuki Hayashi, Nagoya Univ. (Japan)
NASA Goddard Space Flight Ctr. (United States)
Ryoko Nakamura, Institute of Space and Astronautical Science (Japan)
Japan Aerospace Exploration Agency (Japan)


Published in SPIE Proceedings Vol. 10399:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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