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Advances toward submicron resolution optics for x-ray instrumentation and applications
Author(s): Mark Cordier; Benjamin Stripe; Wenbing Yun; S. H. Lau; Alan Lyon; David Reynolds; Sylvia J. Y. Lewis; Sharon Chen; Vladimir A. Semenov; Richard I. Spink; Srivatsan Seshadri
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Paper Abstract

Sigray’s axially symmetric x-ray optics enable advanced microanalytical capabilities for focusing x-rays to microns-scale to submicron spot sizes, which can potentially unlock many avenues for laboratory micro-analysis. The design of these optics allows submicron spot sizes even at low x-ray energies, enabling research into low atomic number elements and allows increased sensitivity of grazing incidence measurements and surface analysis. We will discuss advances made in the fabrication of these double paraboloidal mirror lenses designed for use in laboratory x-ray applications. We will additionally present results from as-built paraboloids, including surface figure error and focal spot size achieved to-date.

Paper Details

Date Published: 23 August 2017
PDF: 7 pages
Proc. SPIE 10386, Advances in X-Ray/EUV Optics and Components XII, 103860D (23 August 2017); doi: 10.1117/12.2273094
Show Author Affiliations
Mark Cordier, Sigray, Inc (United States)
Benjamin Stripe, Sigray, Inc. (United States)
Wenbing Yun, Sigray, Inc. (United States)
S. H. Lau, Sigray, Inc. (United States)
Alan Lyon, Sigray, Inc. (United States)
David Reynolds, Sigray, Inc. (United States)
Sylvia J. Y. Lewis, Sigray, Inc. (United States)
Sharon Chen, Sigray, Inc. (United States)
Vladimir A. Semenov, Sigray, Inc (United States)
Richard I. Spink, Sigray, Inc. (United States)
Srivatsan Seshadri, Sigray, Inc. (United States)


Published in SPIE Proceedings Vol. 10386:
Advances in X-Ray/EUV Optics and Components XII
Christian Morawe; Ali M. Khounsary; Shunji Goto, Editor(s)

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