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Proceedings Paper

Sharply focused azimuthally polarized beam characterized by photoinduced force microscopy
Author(s): Jinwei Zeng; Fei Huang; Caner Guclu; Mehdi Veysi; Hemantha K. Wickramasinghe; Filippo Capolino
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Date Published:
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Proc. SPIE 10350, Nanoimaging and Nanospectroscopy V, 103500T; doi: 10.1117/12.2273091
Show Author Affiliations
Jinwei Zeng, Univ. of California, Irvine (United States)
Fei Huang, Univ. of California, Irvine (United States)
Caner Guclu, Univ. of California, Irvine (United States)
Mehdi Veysi, Univ. of California, Irvine (United States)
Hemantha K. Wickramasinghe, Univ. of California, Irvine (United States)
Filippo Capolino, Univ. of California, Irvine (United States)


Published in SPIE Proceedings Vol. 10350:
Nanoimaging and Nanospectroscopy V
Prabhat Verma; Alexander Egner, Editor(s)

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