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Spectral correction algorithm for multispectral CdTe x-ray detectors
Author(s): Erik D. Christensen; Jan Kehres; Yun Gu; Robert Feidenhans'l; Ulrik L. Olsen
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Paper Abstract

Compared to the dual energy scintillator detectors widely used today, pixelated multispectral X-ray detectors show the potential to improve material identification in various radiography and tomography applications used for industrial and security purposes. However, detector effects, such as charge sharing and photon pileup, distort the measured spectra in high flux pixelated multispectral detectors. These effects significantly reduce the detectors’ capabilities to be used for material identification, which requires accurate spectral measurements. We have developed a semi analytical computational algorithm for multispectral CdTe X-ray detectors which corrects the measured spectra for severe spectral distortions caused by the detector. The algorithm is developed for the Multix ME100 CdTe X-ray detector, but could potentially be adapted for any pixelated multispectral CdTe detector. The calibration of the algorithm is based on simple attenuation measurements of commercially available materials using standard laboratory sources, making the algorithm applicable in any X-ray setup. The validation of the algorithm has been done using experimental data acquired with both standard lab equipment and synchrotron radiation. The experiments show that the algorithm is fast, reliable even at X-ray flux up to 5 Mph/s/mm2, and greatly improves the accuracy of the measured X-ray spectra, making the algorithm very useful for both security and industrial applications where multispectral detectors are used.

Paper Details

Date Published: 7 September 2017
PDF: 15 pages
Proc. SPIE 10393, Radiation Detectors in Medicine, Industry, and National Security XVIII, 103930H (7 September 2017); doi: 10.1117/12.2272935
Show Author Affiliations
Erik D. Christensen, Niels Bohr Institute, Univ. of Copenhagen (Denmark)
Jan Kehres, Technical Univ. of Denmark (Denmark)
Yun Gu, Technical Univ. of Denmark (Denmark)
Robert Feidenhans'l, European XFEL GmbH (Germany)
Ulrik L. Olsen, Technical Univ. of Denmark (Denmark)


Published in SPIE Proceedings Vol. 10393:
Radiation Detectors in Medicine, Industry, and National Security XVIII
Gary P. Grim; Lars R. Furenlid; H. Bradford Barber, Editor(s)

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