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Proceedings Paper

Phase analysis of VO2 thin film and the mechanism of the electrically triggered metal-insulator transition of VO2
Author(s): Seong Hyun Kim; Bong-Jun Kim; Giwan Seo; Jeongyong Choi; Yong Wook Lee; Sang Chul Lim
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Paper Abstract

Many researchers have produced various results for the mechanism of the metal-insulator transition (MIT) of VO2. This seems to be because of the influence of various VOx phases in the sample thin-film. VOx has many phases, and VO2 is in only a small window in the VOx phase diagram. In this work, VO2 thin films on Al2O3 substrates were prepared by a pulsed laser deposition method, and their I-V properties were measured over a temperature range from 50 K to 300 K. In the thin-films, not only the VO2 phase, but also at least two other VOx phases were present, including V2O3 and V5O9. For electrically triggered MIT, a space charge limit current (SCLC) appeared at high voltages while ohmic current appeared at low voltages, and MIT occurred when the space charge density became greater than the critical carrier density, nc. This is a current-driven device, basically, because MIT occurs after the charge carrier density, which is injected from the electrode becomes higher than nc. The switching time, which is the time for the whole sample to transition from insulator to metal because of bias application, depends on the charge carrier mobility in the insulator state. The switching speed of VO2 due to electrical triggering must be slower than that of optical triggering because the mobility of the charge carrier in the insulating state is only 0.5 cm2/V•s. For a simple two terminal model, the switching speed is proportional to the square of the length between the two electrodes and the mobility of the charge carrier, and inversely proportional to the voltage. Therefore, a proper switching speed can be designed for one’s use if the appropriate material and dimension of the device are used.

Paper Details

Date Published: 28 August 2017
PDF: 7 pages
Proc. SPIE 10344, Nanophotonic Materials XIV, 103440Q (28 August 2017); doi: 10.1117/12.2272657
Show Author Affiliations
Seong Hyun Kim, Electronics and Telecommunications Research Institute (Korea, Republic of)
Bong-Jun Kim, Mobrick Co. Ltd. (Korea, Republic of)
Giwan Seo, Pukyoung National Univ. (Korea, Republic of)
Jeongyong Choi, Pukyoung National Univ. (Korea, Republic of)
Yong Wook Lee, Pukyoung National Univ. (Korea, Republic of)
Sang Chul Lim, Hanbat National Univ. (Korea, Republic of)


Published in SPIE Proceedings Vol. 10344:
Nanophotonic Materials XIV
Stefano Cabrini; Gilles Lérondel; Adam M. Schwartzberg; Taleb Mokari, Editor(s)

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