Share Email Print
cover

Proceedings Paper

Diffraction efficiency of a replicated large-format x-ray reflection grating (Conference Presentation)
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Future soft X-ray spectroscopy missions have science requirements that demand higher instrument throughput and higher resolution than currently available technology. A key element in such spectrometers are dispersive elements such as diffraction gratings. Our group at Penn State University develops and fabricates off-plane reflection gratings in an effort to achieve the level of performance required by future missions. We present here efficiency measurements made in the 0.2 – 1.3 keV energy band at the Advanced Light Source (ALS) at Lawrence Berkley National Laboratory for one such grating, which was fabricated to achieve the high-throughput required for future observatories. This grating was replicated from a grating master using UV-nanoimprint techniques which are suitable for mass-production and is coated in a layer of gold. Total absolute diffraction efficiency was measured to be ~55-65% across the energy range, with relative diffraction efficiency approaching 90%. These results represent the first successful demonstration of off-plane grating replicas produced via these fabrication techniques and exceed the grating efficiency requirements for future X-ray missions.

Paper Details

Date Published: 19 September 2017
PDF
Proc. SPIE 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII, 1039913 (19 September 2017); doi: 10.1117/12.2272605
Show Author Affiliations
Drew M. Miles, The Pennsylvania State Univ. (United States)
Jake McCoy, The Pennsylvania State Univ. (United States)
Randall L. McEntaffer, The Pennsylvania State Univ. (United States)
Casey T. DeRoo, Harvard-Smithsonian Ctr. for Astrophysics (United States)


Published in SPIE Proceedings Vol. 10399:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

© SPIE. Terms of Use
Back to Top