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Proceedings Paper

Dynamic metrology and data processing for precision freeform optics fabrication and testing
Author(s): Maham Aftab; Isaac Trumper; Lei Huang; Heejoo Choi; Wenchuan Zhao; Logan Graves; Chang Jin Oh; Dae Wook Kim
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Paper Abstract

Dynamic metrology holds the key to overcoming several challenging limitations of conventional optical metrology, especially with regards to precision freeform optical elements. We present two dynamic metrology systems: 1) adaptive interferometric null testing; and 2) instantaneous phase shifting deflectometry, along with an overview of a gradient data processing and surface reconstruction technique. The adaptive null testing method, utilizing a deformable mirror, adopts a stochastic parallel gradient descent search algorithm in order to dynamically create a null testing condition for unknown freeform optics. The single-shot deflectometry system implemented on an iPhone uses a multiplexed display pattern to enable dynamic measurements of time-varying optical components or optics in vibration. Experimental data, measurement accuracy / precision, and data processing algorithms are discussed.

Paper Details

Date Published: 15 June 2017
PDF: 8 pages
Proc. SPIE 10326, Fourth European Seminar on Precision Optics Manufacturing, 103260H (15 June 2017); doi: 10.1117/12.2272353
Show Author Affiliations
Maham Aftab, College of Optical Sciences, The Univ. of Arizona (United States)
Isaac Trumper, College of Optical Sciences, The Univ. of Arizona (United States)
Lei Huang, Tsinghua Univ. (China)
Heejoo Choi, College of Optical Sciences, The Univ. of Arizona (United States)
Wenchuan Zhao, Institute of Optics and Electronics (China)
Logan Graves, College of Optical Sciences, The Univ. of Arizona (United States)
Chang Jin Oh, College of Optical Sciences, The Univ. of Arizona (United States)
Dae Wook Kim, College of Optical Sciences, The Univ. of Arizona (United States)
Steward Observatory, The Univ. of Arizona


Published in SPIE Proceedings Vol. 10326:
Fourth European Seminar on Precision Optics Manufacturing
Oliver W. Fähnle; Rolf Rascher; Christine Wünsche, Editor(s)

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