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Proceedings Paper

Inspection planning for coordinate metrology
Author(s): V. N. Narayan Namboothiri; M. S. Shunmugam
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Paper Abstract

A novel model for CMM measurement process using the concept of Self Avoiding Walk is presented. The objective is to find out a sampling lattice which results in reduced measurement time without affecting the precision of the measurement. Sampling in honeycomb lattice is shown to have less mean square displacement than sampling in square lattice as a result of which sampling in honeycomb lattice requires less measurement time than sampling in square lattice. Further it is shown that the sampling in honeycomb lattice resembles the unaligned systematic sampling which again increases the precision of the sampling in honeycomb lattice.

Paper Details

Date Published: 21 November 1995
PDF: 9 pages
Proc. SPIE 2596, Modeling, Simulation, and Control Technologies for Manufacturing, (21 November 1995); doi: 10.1117/12.227227
Show Author Affiliations
V. N. Narayan Namboothiri, Indian Institute of Technology Madras (India)
M. S. Shunmugam, Indian Institute of Technology Madras (India)


Published in SPIE Proceedings Vol. 2596:
Modeling, Simulation, and Control Technologies for Manufacturing
Ronald Lumia, Editor(s)

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