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Proceedings Paper

Increase in the measurement of the normal vectors of an aspherical surface used in deflectometry
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Paper Abstract

We present the numerical simulation of a ray selector with a uniform distribution. This selector shall be used in a deflectometry arrangement and the detection plane of spots necessary in the deflectometry shall be placed at an arbitrary distance from the lens under test. To perform this task, the vector form of the exact ray tracing is used through a lens and from these positions determine the shape of the convex surface of the lens. This program is flexible and can be used on other types of optical surfaces, and different ray distribution, including null distribution. The first preliminary results are shown below.

Paper Details

Date Published: 26 June 2017
PDF: 9 pages
Proc. SPIE 10330, Modeling Aspects in Optical Metrology VI, 103301W (26 June 2017); doi: 10.1117/12.2271872
Show Author Affiliations
Diana Castán-Ricaño, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Fermín S. Granados-Agustín, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
E. Percino-Zacarías, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
A. Cornejo-Rodríguez, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)


Published in SPIE Proceedings Vol. 10330:
Modeling Aspects in Optical Metrology VI
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)

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