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Increasing the space-time product of super-resolution structured illumination microscopy by means of two-pattern illumination
Author(s): F. M. Inochkin; P. Pozzi; V. V. Bezzubik; N. R. Belashenkov
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Paper Abstract

Superresolution image reconstruction method based on the structured illumination microscopy (SIM) principle with reduced and simplified pattern set is presented. The method described needs only 2 sinusoidal patterns shifted by half a period for each spatial direction of reconstruction, instead of the minimum of 3 for the previously known methods. The method is based on estimating redundant frequency components in the acquired set of modulated images. Digital processing is based on linear operations. When applied to several spatial orientations, the image set can be further reduced to a single pattern for each spatial orientation, complemented by a single non-modulated image for all the orientations. By utilizing this method for the case of two spatial orientations, the total input image set is reduced up to 3 images, providing up to 2-fold improvement in data acquisition time compared to the conventional 3-pattern SIM method. Using the simplified pattern design, the field of view can be doubled with the same number of spatial light modulator raster elements, resulting in a total 4-fold increase in the space-time product. The method requires precise knowledge of the optical transfer function (OTF). The key limitation is the thickness of object layer that scatters or emits light, which requires to be sufficiently small relatively to the lens depth of field. Numerical simulations and experimental results are presented. Experimental results are obtained on the SIM setup with the spatial light modulator based on the 1920x1080 digital micromirror device.

Paper Details

Date Published: 26 June 2017
PDF: 11 pages
Proc. SPIE 10333, Optical Methods for Inspection, Characterization, and Imaging of Biomaterials III, 103330K (26 June 2017); doi: 10.1117/12.2271835
Show Author Affiliations
F. M. Inochkin, ITMO Univ. (Russian Federation)
Saint-Petersburg State Polytechnical Univ. (Russian Federation)
P. Pozzi, Technische Univ. Delft (Netherlands)
V. V. Bezzubik, ITMO Univ. (Russian Federation)
N. R. Belashenkov, ITMO Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 10333:
Optical Methods for Inspection, Characterization, and Imaging of Biomaterials III
Pietro Ferraro; Simonetta Grilli; Monika Ritsch-Marte; Christoph K. Hitzenberger, Editor(s)

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