Share Email Print
cover

Proceedings Paper • new

Validation of a semi-automatic protocol for the assessment of the tear meniscus central area based on open-source software
Author(s): Hugo Pena-Verdeal; Carlos Garcia-Resua; Eva Yebra-Pimentel; Maria J. Giraldez
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Purpose: Different lower tear meniscus parameters can be clinical assessed on dry eye diagnosis. The aim of this study was to propose and analyse the variability of a semi-automatic method for measuring lower tear meniscus central area (TMCA) by using open source software. Material and methods: On a group of 105 subjects, one video of the lower tear meniscus after fluorescein instillation was generated by a digital camera attached to a slit-lamp. A short light beam (3x5 mm) with moderate illumination in the central portion of the meniscus (6 o’clock) was used. Images were extracted from each video by a masked observer. By using an open source software based on Java (NIH ImageJ), a further observer measured in a masked and randomized order the TMCA in the short light beam illuminated area by two methods: (1) manual method, where TMCA images was “manually” measured; (2) semi-automatic method, where TMCA images were transformed in an 8-bit-binary image, then holes inside this shape were filled and on the isolated shape, the area size was obtained. Finally, both measurements, manual and semi-automatic, were compared. Results: Paired t-test showed no statistical difference between both techniques results (p = 0.102). Pearson correlation between techniques show a significant positive near to perfect correlation (r = 0.99; p < 0.001). Conclusions: This study showed a useful tool to objectively measure the frontal central area of the meniscus in photography by free open source software.

Paper Details

Date Published: 22 August 2017
PDF: 8 pages
Proc. SPIE 10453, Third International Conference on Applications of Optics and Photonics, 104530O (22 August 2017); doi: 10.1117/12.2271783
Show Author Affiliations
Hugo Pena-Verdeal, Univ. de Santiago de Compostela (Spain)
Carlos Garcia-Resua, Univ. de Santiago de Compostela (Spain)
Eva Yebra-Pimentel, Univ. de Santiago de Compostela (Spain)
Maria J. Giraldez, Univ. de Santiago de Compostela (Spain)


Published in SPIE Proceedings Vol. 10453:
Third International Conference on Applications of Optics and Photonics
Manuel Filipe P. C. M. Martins Costa, Editor(s)

© SPIE. Terms of Use
Back to Top