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Proceedings Paper

Information recovery in propagation-based imaging with decoherence effects
Author(s): Heinrich Froese; Lars Lötgering; Thomas Wilhein
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Paper Abstract

During the past decades the optical imaging community witnessed a rapid emergence of novel imaging modalities such as coherent diffraction imaging (CDI), propagation-based imaging and ptychography. These methods have been demonstrated to recover complex-valued scalar wave fields from redundant data without the need for refractive or diffractive optical elements. This renders these techniques suitable for imaging experiments with EUV and x-ray radiation, where the use of lenses is complicated by fabrication, photon efficiency and cost. However, decoherence effects can have detrimental effects on the reconstruction quality of the numerical algorithms involved. Here we demonstrate propagation-based optical phase retrieval from multiple near-field intensities with decoherence effects such as partially coherent illumination, detector point spread, binning and position uncertainties of the detector. Methods for overcoming these systematic experimental errors - based on the decomposition of the data into mutually incoherent modes - are proposed and numerically tested. We believe that the results presented here open up novel algorithmic methods to accelerate detector readout rates and enable subpixel resolution in propagation-based phase retrieval. Further the techniques are straightforward to be extended to methods such as CDI, ptychography and holography.

Paper Details

Date Published: 15 May 2017
PDF: 9 pages
Proc. SPIE 10233, Holography: Advances and Modern Trends V, 102331A (15 May 2017); doi: 10.1117/12.2271699
Show Author Affiliations
Heinrich Froese, Hochschule Koblenz Univ. of Applied Sciences (Germany)
Lars Lötgering, Hochschule Koblenz Univ. of Applied Sciences (Germany)
Thomas Wilhein, Hochschule Koblenz Univ. of Applied Sciences (Germany)

Published in SPIE Proceedings Vol. 10233:
Holography: Advances and Modern Trends V
Miroslav Hrabovský; John T. Sheridan; Antonio Fimia, Editor(s)

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