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Proceedings Paper

SSM/T-2 measurements: a descriptive overview
Author(s): Michael K. Griffin; Vincent J. Falcone; John D. Pickle; Ronald G. Isaacs
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Paper Abstract

Since August of 1994, the Defense Meteorological Satellite Program (DMSP) has had on-orbit two satellite platforms (F-11 and F-12) which carry the special sensor microwave water vapor sounder (SSM/T-2). The sensor consists of 5 channels: three located symmetrically about the 183 GHz water vapor absorption line, one at 150 GHz and a 91.65 GHz window channel. Calibration of the SSM/T-2 on both platforms was undertaken to verify the absolute accuracy of the microwave measurements. Initial findings show a discrepancy between measurements from the SSM/T-2 and an independent aircraft-mounted instrument of only 1-1.6 K at 183 GHz. Basic channel information obtained from radiative transfer modeling provides an insight into the surface and atmospheric contributions to the channel observations and the sensitivity of the channels to various atmospheric phenomena. From the modeling and calibration studies a number of interesting channel signatures were observed in the SSM/T-2 measurements including the effects of the underlying surface, fractional cloud coverage and type, and precipitation occurrence. The signatures of clouds and precipitation (over water and land) have been identified and efforts to derive detection algorithms have been made.

Paper Details

Date Published: 21 November 1995
PDF: 11 pages
Proc. SPIE 2584, Synthetic Aperture Radar and Passive Microwave Sensing, (21 November 1995); doi: 10.1117/12.227152
Show Author Affiliations
Michael K. Griffin, Air Force Phillips Lab. (United States)
Vincent J. Falcone, Air Force Phillips Lab. (United States)
John D. Pickle, Atmospheric and Environmental Research, Inc. (United States)
Ronald G. Isaacs, Atmospheric and Environmental Research, Inc. (United States)


Published in SPIE Proceedings Vol. 2584:
Synthetic Aperture Radar and Passive Microwave Sensing
Giorgio Franceschetti; Christopher John Oliver; James C. Shiue; Shahram Tajbakhsh, Editor(s)

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