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Proceedings Paper

First results of X-SAR interferometry
Author(s): Joao R. Moreira; Marcus Schwaebisch; Gianfranco Fornaro; Riccardo Lanari; Richard Bamler; Dieter Just; U. Steinbrecher; H. Breit; M. Eineder; Giorgio Franceschetti; D. Geudtner; H. Rinkel
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Paper Abstract

Repeat-pass interferometry data have been acquired during the first and second SIR-C/X-SAR missions in April and October 1994. This paper presents the first results from X-SAR interferometry on four different sites. The temporal separations were one day and six months. At two sites the coherence requirements were met, resulting in high quality interferograms. A digital elevation model has been derived. The limitations of the X-SAR interferometry are discussed.

Paper Details

Date Published: 21 November 1995
PDF: 13 pages
Proc. SPIE 2584, Synthetic Aperture Radar and Passive Microwave Sensing, (21 November 1995); doi: 10.1117/12.227145
Show Author Affiliations
Joao R. Moreira, German Aerospace Research Establishment (Germany)
Marcus Schwaebisch, German Aerospace Research Establishment (Germany)
Gianfranco Fornaro, Univ. di Napoli (Italy)
Riccardo Lanari, IRECE/CNR (Italy)
Richard Bamler, German Aerospace Research Establishment (Germany)
Dieter Just, German Aerospace Research Establishment (Germany)
U. Steinbrecher, German Aerospace Research Establishment (Germany)
H. Breit, German Aerospace Research Establishment (Germany)
M. Eineder, German Aerospace Research Establishment (Germany)
Giorgio Franceschetti, Univ. di Napoli and IRECE/CNR (Italy)
D. Geudtner, German Aerospace Research Establishment (Germany)
H. Rinkel, German Aerospace Research Establishment (Germany)


Published in SPIE Proceedings Vol. 2584:
Synthetic Aperture Radar and Passive Microwave Sensing
Giorgio Franceschetti; Christopher John Oliver; James C. Shiue; Shahram Tajbakhsh, Editor(s)

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