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Proceedings Paper

Clutter discrimination in polarimetric SAR imagery
Author(s): David Blacknell; Robert J.A. Tough
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Paper Abstract

Polarimetric SAR images will contain extended regions of apparently homogeneous clutter arising, perhaps, from areas of vegetation or uniformly driven expanses of water. Such regions may contain localized clutter variations which indicate the presence of features of interest such as changes in vegetation density due to environmental effects, damping of the sea surface due to the presence of pollutants or the effects of partially concealed land-based or maritime military targets. It is thus of interest to develop techniques which can discriminate localized clutter features from the background clutter. If the distribution parameter values are known for both background and feature then the likelihood ratio method can be used. Frequently, however, the feature parameter values are unknown in which case one option is to use simply the background likelihood. In both cases, quadratic test statistics result which are analyzed to allow a comparison of theoretical performances. A second option is to introduce a probability distribution for the feature parameter values. Optimum performance will result if the assumed and true distributions match exactly but any mismatch may considerably reduce the performance. Simulations are used to investigate this effect. In conclusion, the paper assesses the various discrimination techniques in terms of complexity, prior knowledge requirements and performance.

Paper Details

Date Published: 21 November 1995
PDF: 12 pages
Proc. SPIE 2584, Synthetic Aperture Radar and Passive Microwave Sensing, (21 November 1995); doi: 10.1117/12.227127
Show Author Affiliations
David Blacknell, Defence Research Agency Malvern (United Kingdom)
Robert J.A. Tough, Defence Research Agency Malvern (United Kingdom)


Published in SPIE Proceedings Vol. 2584:
Synthetic Aperture Radar and Passive Microwave Sensing
Giorgio Franceschetti; Christopher John Oliver; James C. Shiue; Shahram Tajbakhsh, Editor(s)

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