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Proceedings Paper

Single-shot color fringe projection profilometry using two-step phase shifting and centerline marker
Author(s): Shuo Xing; Ping Chen; Yi Xiao
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Paper Abstract

A single-shot color fringe projection profilometry is proposed to measure a diffuse object by using two-step phase shifting and centerline marker. One color fringe pattern encoded with two sinusoidal patterns and one rectangular pulse pattern is projected by a DLP project and recorded by a CCD camera. The approach requires two sinusoidal patterns, which is composed of the red and blue components, to establish two-step phase shifting for wrapping the primary phase, and needs a centerline marker, which is encoded in the green channel, to obtain the phase order for unwrapping the absolute phase. Simulation and experiment results demonstrate that the proposed approach is able to effectively unwrap the absolute phase and compensate the phase errors.

Paper Details

Date Published: 13 June 2017
PDF: 8 pages
Proc. SPIE 10449, Fifth International Conference on Optical and Photonics Engineering, 1044922 (13 June 2017); doi: 10.1117/12.2270797
Show Author Affiliations
Shuo Xing, Shanghai Univ. (China)
Ping Chen, Shanghai Univ. (China)
Yi Xiao, Nantong Vocational Univ. (China)


Published in SPIE Proceedings Vol. 10449:
Fifth International Conference on Optical and Photonics Engineering
Anand Krishna Asundi, Editor(s)

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