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Proceedings Paper

Improvement of phase measurement accuracy and stability in dual-wavelength common-path digital holographic microscopy
Author(s): Jianglei Di; Yu Song; Teli Xi; Jiwei Zhang; Ying Li; Chaojie Ma; Kaiqiang Wang; Jianlin Zhao
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Paper Abstract

A dual-wavelength common-path digital holographic microscopy is presented to simultaneously improve the phase measurement accuracy and stability. Two laser beams with different wavelength are reflected by the front and back surface of a parallel glass plate to form the composite hologram in the lateral shearing region, and a shorter synthetic wavelength Λ289nm is obtained by calculating the arctangent and product of the two reconstructed complex amplitudes. Thus, phase speckle noise can be reduced in the dual-wavelength numerical reconstruction process, and the phase measurement accuracy and stability can be improved. The experiment results of the peony pollens specimen show the feasibility of the proposed configuration.

Paper Details

Date Published: 13 June 2017
PDF: 6 pages
Proc. SPIE 10449, Fifth International Conference on Optical and Photonics Engineering, 104491W (13 June 2017); doi: 10.1117/12.2270774
Show Author Affiliations
Jianglei Di, Northwestern Polytechnical Univ. (China)
Yu Song, Northwestern Polytechnical Univ. (China)
Teli Xi, Northwestern Polytechnical Univ. (China)
Jiwei Zhang, Northwestern Polytechnical Univ. (China)
Ying Li, Northwestern Polytechnical Univ. (China)
Chaojie Ma, Northwestern Polytechnical Univ. (China)
Kaiqiang Wang, Northwestern Polytechnical Univ. (China)
Jianlin Zhao, Northwestern Polytechnical Univ. (China)


Published in SPIE Proceedings Vol. 10449:
Fifth International Conference on Optical and Photonics Engineering
Anand Krishna Asundi, Editor(s)

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