Share Email Print
cover

Proceedings Paper • new

Expansion of measurement area of three-dimensional deformation measurement speckle interferometry with same sensitivities in three directions under consideration of measurement sensitivity
Author(s): Y. Arai
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A novel in-plane and out-of-plane deformation simultaneous measurement method using only two speckle patterns grabbed before and after deformation of an object with rough surfaces has been proposed. Then, the same measurement sensitivities in three directions can be set in this system. However, the method has some area which cannot measure a deformation. In this paper, new optical system which is not based on orthogonal laser beams is proposed to expand the measurement area of the method under consideration of measurement sensitivity. The improvement of deformation measurement area where the deformation distribution cannot be measured by the conventional optical system is discussed in the proposed method.

Paper Details

Date Published: 23 August 2017
PDF: 8 pages
Proc. SPIE 10373, Applied Optical Metrology II, 1037305 (23 August 2017); doi: 10.1117/12.2270733
Show Author Affiliations
Y. Arai, Kansai Univ. (Japan)


Published in SPIE Proceedings Vol. 10373:
Applied Optical Metrology II
Erik Novak; James D. Trolinger, Editor(s)

© SPIE. Terms of Use
Back to Top