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Investigating radiation induced damage processes with femtosecond x-ray pulses (Conference Presentation)
Author(s): Changyong Song
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Paper Abstract

Interest in high-resolution structure investigation has been zealous, especially with the advent of X-ray free electron lasers (XFELs). The intense and ultra-short X-ray laser pulses (~ 10 GW) pave new routes to explore structures and dynamics of single macromolecules, functional nanomaterials and complex electronic materials. In the last several years, we have developed XFEL single-shot diffraction imaging by probing ultrafast phase changes directly. Pump-probe single-shot imaging was realized by synchronizing femtosecond (<10 fs in FWHM) X-ray laser (probe) with femtosecond (50 fs) IR laser (pump) at better than 1 ps resolution. Nanoparticles under intense fs-laser pulses were investigated with fs XFEL pulses to provide insight into the irreversible particle damage processes with nanoscale resolution. Research effort, introduced, aims to extend the current spatio-temporal resolution beyond the present limit. We expect this single-shot dynamic imaging to open new science opportunity with XFELs.

Paper Details

Date Published: 21 June 2017
PDF: 1 pages
Proc. SPIE 10236, Damage to VUV, EUV, and X-ray Optics VI, 102360B (21 June 2017); doi: 10.1117/12.2270685
Show Author Affiliations
Changyong Song, POSTECH (Korea, Republic of)


Published in SPIE Proceedings Vol. 10236:
Damage to VUV, EUV, and X-ray Optics VI
Libor Juha; Saša Bajt; Regina Soufli, Editor(s)

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