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Phase retrieval technology within a single shot using multi-focal lengths chromatic aberration system
Author(s): Yi Yang; Xuanzhe Zhang; Shaojun Du; Qiong Zhou; Quan Sun
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Paper Abstract

Full-aperture noninterferometric phase retrieval system, namely one single shot, can overcome the impact of low Signal-to-Noise ratio in the condition of weak illumination by extended beacon. Contributing to its robustness and practicability, the technology has been widely applied in industrial inspections. However, the technology is limited by the operational speed and the accuracy of the phase retrieval algorithm in most situations. Based on phase space optics, an analytical relationship can be set up between the phase of the quasi-coherent light field from the extended beacon of small field of view and 3 adjacent intensity distributions, which may be resolved fast. That is, the unknown phase is equal to the convolution of the partial differential of the difference value of the three intensities with respect to the rotation angle of the phase space and the sign function. This paper introduces a design and realization which accomplishes this goal using a specially designed chromatic aberration lens and a 3CCD camera. By this way, three high resolution images of the beacon can be captured within a single shot. The numerical simulation results show that the method can accurately recover aberrations of more than 10 orders.

Paper Details

Date Published: 26 June 2017
PDF: 9 pages
Proc. SPIE 10330, Modeling Aspects in Optical Metrology VI, 103301T (26 June 2017); doi: 10.1117/12.2270401
Show Author Affiliations
Yi Yang, Anhui Institute of Optics and Fine Mechanics (China)
Univ. of Science and Technology of China (China)
National Univ. of Defense Technology (China)
Xuanzhe Zhang, Anhui Institute of Optics and Fine Mechanics (China)
Univ. of Science and Technology of China (China)
National Univ. of Defense Technology (China)
Shaojun Du, National Univ. of Defense Technology (China)
Qiong Zhou, National Univ. of Defense Technology (China)
Quan Sun, National Univ. of Defense Technology (China)


Published in SPIE Proceedings Vol. 10330:
Modeling Aspects in Optical Metrology VI
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)

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