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Proceedings Paper

Superresolution imaging in spatially multiplexed interferometric microscopy by using time multiplexing
Author(s): Vicente Micó; José Ángel Picazo-Bueno; Zeev Zalevsky; Javier García; Carlos Ferreira
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Paper Abstract

We report on the merging between our recently introduced SMIM (initials incoming from Spatially-Multiplexed Interferometric Microscopy) technique and superresolution imaging. SMIM has been previously reported [Opt. Express 22, 14929 (2014); J. Bio. Opt. 21, 106007 (2016)] as a low cost, extremely simple, and highly stable scheme to update a standard microscope into a holographic microscope but, as consequence, the usable FOV is reduced. Superresolution capability enables to enhance the resolution limit in the usable FOV thus compensating the FOV reduction. In this contribution, superresolution is implemented joint together with SMIM defining a new method named as S2MIM (initials incoming from Superresolved Spatially Multiplexed Interferometric Microscopy) which updates a commercially available non-holographic microscope into a superresolved holographic one. Experimental validation is presented for an Olympus BX-60 upright microscope with a USAF resolution test target as calibration object.

Paper Details

Date Published: 26 June 2017
PDF: 7 pages
Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103294C (26 June 2017); doi: 10.1117/12.2270396
Show Author Affiliations
Vicente Micó, Univ. de València (Spain)
José Ángel Picazo-Bueno, Univ. de València (Spain)
Zeev Zalevsky, Bar-Ilan Univ. (Israel)
Javier García, Univ. de València (Spain)
Carlos Ferreira, Univ. de València (Spain)

Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves, Editor(s)

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