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Proceedings Paper

Active marks structure optimization for optical-electronic systems of spatial position control of industrial objects
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Paper Abstract

The article is devoted to the optimization of optoelectronic systems of the spatial position of objects. Probabilistic characteristics of the detection of an active structured mark on a random noisy background are investigated.

The developed computer model and the results of the study allow us to estimate the probabilistic characteristics of detection of a complex structured mark on a random gradient background, and estimate the error of spatial coordinates. The results of the study make it possible to improve the accuracy of measuring the coordinates of the object. Based on the research recommendations are given on the choice of parameters of the optimal mark structure for use in opticalelectronic systems for monitoring the spatial position of large-sized structures.

Paper Details

Date Published: 26 June 2017
PDF: 6 pages
Proc. SPIE 10330, Modeling Aspects in Optical Metrology VI, 103301H (26 June 2017); doi: 10.1117/12.2270189
Show Author Affiliations
Elena A. Sycheva, ITMO Univ. (Russian Federation)
Aleksandr S. Vasilev, ITMO Univ. (Russian Federation)
Oleg U. Lashmanov, ITMO Univ. (Russian Federation)
Valery V. Korotaev, ITMO Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 10330:
Modeling Aspects in Optical Metrology VI
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)

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