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Proceedings Paper

Surface contouring digital holographic microscopy for shape measurement
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Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, ; doi: 10.1117/12.2270092
Show Author Affiliations
Marta Mikula, Warsaw Univ. of Technology (Poland)
Tomasz Kozacki, Warsaw Univ. of Technology (Poland)
Julianna Kostencka, Warsaw Univ. of Technology (Poland)
Michał Józwik, Warsaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves, Editor(s)

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