Share Email Print
cover

Proceedings Paper

High precision laser photometer for laser optics
Author(s): Yuan'an Zhao; Guohang Hu; Zhen Cao; Shijie Liu; Meiping Zhu; Jianda Shao
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Development of laser systems requires optical components with high performance, and a high-precision double-beam laser photometer was designed and established to measure the optical performance at 1064nm. Double beam design and lock-in technique was applied to decrease the impact of light energy instability and electric noise. Pairs of samples were placed symmetrically to eliminate beam displacement, and laser scattering imaging technique was applied to determine the influence of surface defect on the optical performance. Based on the above techniques, transmittance and reflection of pairs of optics were obtained, and the measurement precision was improved to 0.06%. Different types of optical loss, such as total loss, volume loss, residual reflection and surface scattering loss, were obtained from the transmittance and reflection measurement of samples with different thickness. Comparison of optical performance of the test points with and without surface defects, the influence of surface defects on optical performance was determined. The optical performance of Nd-glass at 1064nm were measured as an example. Different types of optical loss and the influence of surface defects on the optical loss was determined.

Paper Details

Date Published: 26 June 2017
PDF: 11 pages
Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103293N (26 June 2017); doi: 10.1117/12.2270075
Show Author Affiliations
Yuan'an Zhao, Shanghai Institute of Optics and Fine Mechanics (China)
Guohang Hu, Shanghai Institute of Optics and Fine Mechanics (China)
Zhen Cao, Shanghai Institute of Optics and Fine Mechanics (China)
Graduate Univ. of Chinese Academy of Sciences (China)
Shijie Liu, Shanghai Institute of Optics and Fine Mechanics (China)
Meiping Zhu, Shanghai Institute of Optics and Fine Mechanics (China)
Jianda Shao, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves, Editor(s)

© SPIE. Terms of Use
Back to Top