Share Email Print
cover

Proceedings Paper

Phase retrieval for high-speed 3D measurement using binary patterns with projector defocusing
Author(s): Dongliang Zheng; Qian Kemao; Feipeng Da; Hock Soon Seah
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Recent digital technology allows binary patterns to be projected with a very high speed, which shows great potential for high-speed 3D measurement. However, how to retrieve an accurate phase with an even faster speed is still challenging. In this paper, an accurate and efficient phase retrieval technique is presented, which combines a Hilbert three-step phaseshifting algorithm with a ternary Gray code-based phase unwrapping method. The Hilbert three-step algorithm uses three squared binary patterns, which can calculate an accurate phase even under a slight defocusing level. The ternary Gray code-based method uses four binary patterns, which can unwrap a phase with a large number of fringe periods. Both simulations and experiments have validated its accuracy and efficiency.

Paper Details

Date Published: 26 June 2017
PDF: 6 pages
Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103290V (26 June 2017); doi: 10.1117/12.2270064
Show Author Affiliations
Dongliang Zheng, Southeast Univ. (China)
Qian Kemao, Nanyang Technological Univ. (Singapore)
Feipeng Da, Southeast Univ. (China)
Hock Soon Seah, Nanyang Technological Univ. (Singapore)


Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves, Editor(s)

© SPIE. Terms of Use
Back to Top