Share Email Print
cover

Proceedings Paper

Phase and group refractive indices of air calculation by fitting of phase difference measured using a combination of laser and low-coherence interferometry
Author(s): Tomáš Pikálek; Martin Šarbort; Ondřej Číp; Minh Tuan Pham; Adam Lešundák; Lenka Pravdová; Zdeněk Buchta
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The air refractive index is an important parameter in interferometric length measurements, since it substantially affects the measurement accuracy. We present a refractive index of air measurement method based on monitoring the phase difference between the ambient air and vacuum inside a permanently evacuated double-spaced cell. The cell is placed in one arm of the Michelson interferometer equipped with two light sources—red LED and HeNe laser, while the low-coherence and laser interference signals are measured separately. Both phase and group refractive indices of air can be calculated from the measured signals. The method was experimentally verified by comparing the obtained refractive index values with two different techniques.

Paper Details

Date Published: 26 June 2017
PDF: 10 pages
Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103293I (26 June 2017); doi: 10.1117/12.2269952
Show Author Affiliations
Tomáš Pikálek, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Martin Šarbort, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Ondřej Číp, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Minh Tuan Pham, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Adam Lešundák, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Lenka Pravdová, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Zdeněk Buchta, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)


Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves, Editor(s)

© SPIE. Terms of Use
Back to Top