Share Email Print

Proceedings Paper

Error influences of the shear element in interferometry for form characterization of optics
Author(s): Jan-Hendrik Hagemann; Claas Falldorf; Gerd Ehret; Ralf B. Bergmann
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A shearing interferometer combined with an LED multispot illumination provides a high flexibility form characterization of optical surfaces as it is needed for aspheres and freeforms. Core element of the setup is the spatial light modulator as shearing element (SLM). Error influences due to the used blazed grating of the SLM need to be investigated. We show results of wavefront measurements with a Shack-Hartmann sensor which demonstrate residual structures of the grating at the wavefront under test. Additionally, simulated data are compared to the measurements to get a better understanding of the expected effects. These investigations help to correct the wavefront under test for this static error and improve the accuracy of the form characterisation.

Paper Details

Date Published: 26 June 2017
PDF: 11 pages
Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103291T (26 June 2017); doi: 10.1117/12.2269932
Show Author Affiliations
Jan-Hendrik Hagemann, Physikalisch-Technische Bundesanstalt (Germany)
Claas Falldorf, Bremer Institut für Angewandte Strahltechnik GmbH (Germany)
Gerd Ehret, Physikalisch-Technische Bundesanstalt (Germany)
Ralf B. Bergmann, Bremer Institut für Angewandte Strahltechnik GmbH (Germany)
Univ. Bremen (Germany)

Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves, Editor(s)

© SPIE. Terms of Use
Back to Top