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Proceedings Paper

Temporal diagnostics from photons: the experience with the PALM (Conference Presentation)
Author(s): Pavle Juranic; Ishkhan Gorgisyan; Christian Erny; Rasmus Ischebeck; Luc Patthey; Claude Pradervand; Christopher J. Milne; H. Lemke; Andreas Dax; Milan Radovic; Christoph P. Hauri; Shigeki Owada; Tadashi Togashi; Tsukasa Katayama; Makina Yabashi
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Paper Abstract

The Photon Arrival and Length Monitor (PALM), a THz streak camera device developed by PSI for non-destructive hard x-ray measurements of photon pulse length and arrival time versus a pump laser[1], was brought to the SACLA XFEL[2] in Japan in a cross-calibration temporal diagnostics campaign after an initial experiment where only the PALM was being used[3]. The device was used with 9 keV pink beam and a 9.0 and 8.8 keV two-color mode, successfully measuring the temporal ifnromation of the pulses for several different FEL operating conditions. The most interesting achievement is the PALM’s ability to measure two arrival times of the two colorors as tey are shifted against each other by the FEL, opening up new possibilities in temporal accuracy for two-color experiments. SwissFEL will employ two such devices at the end stations for use by both operators and experimenters to improve the operation of the FEL and to better interpret experimental data. References [1]P. N. Juranić et. al, Journal of Instrumentation (2014) 9. [2]T. Ishikawa et. al., Nature Photonics (2012) 6(8). [3] P. N. Juranić et. al., Optics Express (2014) 22.

Paper Details

Date Published: 25 January 2018
PDF: 1 pages
Proc. SPIE 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV, 1023705 (25 January 2018); doi: 10.1117/12.2269770
Show Author Affiliations
Pavle Juranic, Paul Scherrer Institut (Switzerland)
Ishkhan Gorgisyan, Paul Scherrer Institut (Switzerland)
Christian Erny, Paul Scherrer Institut (Switzerland)
Rasmus Ischebeck, Paul Scherrer Institut (Switzerland)
Luc Patthey, Paul Scherrer Institut (Switzerland)
Claude Pradervand, Paul Scherrer Institut (Switzerland)
Christopher J. Milne, Paul Scherrer Institut (Switzerland)
H. Lemke, Paul Scherrer Institut (Switzerland)
Andreas Dax, Yale Univ. (United States)
Milan Radovic, Paul Scherrer Institut (Switzerland)
Christoph P. Hauri, Paul Scherrer Institut (Switzerland)
Shigeki Owada, RIKEN Harima Branch (Japan)
Tadashi Togashi, RIKEN (Japan)
Tsukasa Katayama, RIKEN (Japan)
Makina Yabashi, Japan Synchrotron Radiation Research Institute (JASRI) (Japan)


Published in SPIE Proceedings Vol. 10237:
Advances in X-ray Free-Electron Lasers Instrumentation IV
Thomas Tschentscher; Luc Patthey, Editor(s)

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