Share Email Print

Proceedings Paper

Fringe projection profilometry based on the best phase sensitivities
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In fringe projection profilometry, the phase sensitivity of a fringe pattern to depth variation of the measured surface is vital to measurement accuracy and resolution. This paper represents the implementation of the optimal fringe pattern with the best phase sensitivities over the whole fringe pattern, and deduces an efficient calibration method to determine the relationship between the phase-difference distribution and the depth variation. In it, first we find the epipole location by projecting sets of horizontal and vertical fringe patterns on several depth-known reference planes, and meanwhile determine the parameters of the measurement system calibration by analyzing the geometry of measurement system. And then project the optimal fringe pattern onto the object to measure. Experimental results demonstrate that this method is very efficient and easy to implement.

Paper Details

Date Published: 28 February 2017
PDF: 8 pages
Proc. SPIE 10256, Second International Conference on Photonics and Optical Engineering, 102560K (28 February 2017); doi: 10.1117/12.2269609
Show Author Affiliations
Ruihua Zhang, Nantong Vocational Univ. (China)
Shanghai Univ. (China)
Hongwei Guo, Shanghai Univ. (China)

Published in SPIE Proceedings Vol. 10256:
Second International Conference on Photonics and Optical Engineering
Chunmin Zhang; Anand Asundi, Editor(s)

© SPIE. Terms of Use
Back to Top