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Proceedings Paper

DMD based digital speckle illumination for high resolution imaging
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Paper Abstract

Spatially non-uniform illumination patterns have shown significant potential to improve the imaging. Recent developments in the patterned illumination microscopy have demonstrated that the use of an optical speckle as an illumination pattern significantly improves the imaging resolution at the same time reducing the computational overheads. We present a DMD based method for generation of digital speckle pattern. The generated digital speckle and uniform white light illumination are used as two illuminations to acquire images. The image reconstruction algorithm for blind structured illumination microscopy is used to get the high resolution image. Our approach does not require any calibration step or stringent control of the illumination, and dramatically simplifies the experimental set-up.

Paper Details

Date Published: 13 June 2017
PDF: 6 pages
Proc. SPIE 10449, Fifth International Conference on Optical and Photonics Engineering, 104490J (13 June 2017); doi: 10.1117/12.2269570
Show Author Affiliations
Anant Shinde, Nanyang Technological Univ. (Singapore)
Ayush Mishra, National Institute of Technology Tiruchirappalli (India)
Sandeep M. Perinchery, Nanyang Technological Univ. (Singapore)
V. Matham Murukeshan, Nanyang Technological Univ. (Singapore)


Published in SPIE Proceedings Vol. 10449:
Fifth International Conference on Optical and Photonics Engineering
Anand Krishna Asundi, Editor(s)

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