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Steps towards traceability for an asphere interferometer
Author(s): I. Fortmeier; M. Stavridis; C. Elster; M. Schulz
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Paper Abstract

Optical systems have increased in quality and capability and are today widely used in many fields of applications. An important step forward was the introduction of aspheres and freeform surfaces. For manufacturing these surfaces in high quality, the accurate measurement of them is highly important. A reliable measurement requires traceability. The concept of traceability is presented, uncertainty sources are itemized and the steps towards traceability for an asphere interferometer are discussed.

Paper Details

Date Published: 26 June 2017
PDF: 9 pages
Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 1032939 (26 June 2017); doi: 10.1117/12.2269122
Show Author Affiliations
I. Fortmeier, Physikalisch-Technische Bundesanstalt (Germany)
M. Stavridis, Physikalisch-Technische Bundesanstalt (Germany)
C. Elster, Physikalisch-Technische Bundesanstalt (Germany)
M. Schulz, Physikalisch-Technische Bundesanstalt (Germany)


Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves, Editor(s)

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