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Proceedings Paper

Statistical characterization of an x-ray FEL in the spectral domain
Author(s): Alberto Lutman; Zhirong Huang; Jacek Krzywinski; Juhao Wu; Diling Zhu; Yiping Feng
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Paper Abstract

We have experimentally measured and characterized a Self-Amplified Spontaneous Emission (SASE) Free Electron Laser (FEL) in the spectral domain. Spectra were captured for hard X-rays using a pair of transmissive bent-crystal spectrometers on a single-shot basis. The probability distributions of the spectral intensity as a function of an increasing bandwidth were studied in different SASE regimes. The number of spectral modes was found to grow linearly in the exponential growth regime, but the growth became super-linear at saturation and in deeper saturation, consistent with the current theoretical understanding and simulations. The spectral intensity fluctuations were found to decrease when a wider portion of the beam (transverse to the direction of the dispersion) was integrated, indicating a partial spatial coherence, the degree of which was then estimated.

Paper Details

Date Published: 23 May 2017
PDF: 10 pages
Proc. SPIE 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV, 102370H (23 May 2017); doi: 10.1117/12.2268918
Show Author Affiliations
Alberto Lutman, SLAC Stanford National Lab. (United States)
Zhirong Huang, SLAC Stanford National Lab. (United States)
Jacek Krzywinski, SLAC Stanford National Lab. (United States)
Juhao Wu, SLAC Stanford National Lab. (United States)
Diling Zhu, SLAC Stanford National Lab. (United States)
Yiping Feng, SLAC Stanford National Lab. (United States)


Published in SPIE Proceedings Vol. 10237:
Advances in X-ray Free-Electron Lasers Instrumentation IV
Thomas Tschentscher; Luc Patthey, Editor(s)

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