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Proceedings Paper

Study on the FOV quality test of the micro channel plate with anti ion feedback by ultraviolet photoelectric method
Author(s): Xiangxin Li; Yufeng Zhu; Ni Zhang; Ziheng Hao
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Paper Abstract

A new method of FOV quality test of the anti ion feedback microchannel plate was introduced, Ultraviolet Photoelectric Method, and the principle and the structure of the device were given. The test principle and device structure are given. The problems in the testing, including the mutual relationship between the UV transmittance and the quantum efficiency of the Au cathode, and the influence of the photoelectrons on the field of view caused by the UV-excited MCP were discussed. The advantages of the UV photoelectron method in the field defect detection were compared. Which provided a basis for the application of Ultraviolet Photoelectric Method and proves the research direction.

Paper Details

Date Published: 8 March 2017
PDF: 11 pages
Proc. SPIE 10255, Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016, 1025551 (8 March 2017); doi: 10.1117/12.2268560
Show Author Affiliations
Xiangxin Li, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night Vision Technology Co., Ltd. (China)
Yufeng Zhu, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night Vision Technology Co., Ltd. (China)
Ni Zhang, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night Vision Technology Co., Ltd. (China)
Ziheng Hao, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night Vision Technology Co., Ltd. (China)


Published in SPIE Proceedings Vol. 10255:
Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016
Yueguang Lv; Jialing Le; Hesheng Chen; Jianyu Wang; Jianda Shao, Editor(s)

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