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Proceedings Paper

Measurement of high accuracy flatness using a commercial interferometer
Author(s): Yuchen Li; Xueyuan Li; Quanzhao Wang; Sen Han; Shouhong Tang; Quanying Wu; Linghua Zhang
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Paper Abstract

Higher accuracy of optical surface measurement is needed with the rapid development of optical industry and technology, especially in the field of optical manufacture and optical metrology. Fizeau interferometery is widely recognized as one of the most important measurement techniques currently in use. Results of the Fizeau interferometeric testing contain the reference surface errors and test surface errors. The test accuracy is restricted by the error of reference surface. As a result, so-called absolute flatness testing technology must be used to eliminate the system error such as reference surface error and higher accuracy of the surface profile testing. In this paper, the theory formula of even and odd functions is deduced, and the method are programmed for simulation. Based on HOOL phase-shifting interferometer, experiments are done to achieve high accuracy flatness measurement. The experiment shows that with high-accuracy interferometer, absolute flatness testing technology can effectively calibrate reference surface and improve the accuracy of flatness surface testing. An important result of this experiment is that the accuracy of the test surface can be reached λ/50.

Paper Details

Date Published: 8 March 2017
PDF: 7 pages
Proc. SPIE 10255, Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016, 102551H (8 March 2017); doi: 10.1117/12.2268364
Show Author Affiliations
Yuchen Li, Suzhou H&L Instruments LLC (China)
Suzhou Univ. of Science and Technology (China)
Xueyuan Li, Suzhou H&L Instruments LLC (China)
Quanzhao Wang, Suzhou W&N Instruments LLC (China)
Sen Han, Univ. of Shanghai for Science and Technology (China)
Suzhou H&L Instruments LLC (China)
Suzhou W&N Instrument LLC (China)
Shouhong Tang, Univ. of Shanghai for Science and Technology (China)
Suzhou H&L Instruments LLC (China)
Suzhou W&N Instruments LLC (China)
Quanying Wu, Suzhou Univ. of Science and Technology (China)
Suzhou H&L Instruments LLC Co. Graduate Workstation (China)
Linghua Zhang, Suzhou H&L Instruments LLC (China)
Suzhou Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 10255:
Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016
Yueguang Lv; Jialing Le; Hesheng Chen; Jianyu Wang; Jianda Shao, Editor(s)

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