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Proceedings Paper

Ultrasonic guided wave based damage imaging by time-reversal method in frequency-wavenumber domain
Author(s): C. G. Xu; B. Q. Xu; Y. Luo; G. D. Xu; L. Z. Lu
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Paper Abstract

More attention has been drawn to ultrasonic guided waves (UGW) based damage detection method for its advantages of wide range inspection of large scale structures. However, complex propagation characteristics of guided waves as well as traditional contact ultrasonic transducers limit its application for the practical damage detection. By combining Scanning Laser Doppler vibrometer (SLDV) technology, Time-Reversal method in frequency-wavenumber domain (f-k RTM) can compensate for the dispersive nature of Lamb waves, localize multiple damage sites and identify their sizes without time consuming numerical calculation. In this work, we adopt f-k RTM for damage detection in plate-like structure. Instead of SLDV in experiment, 3D finite element numerical method is adopted to obtain scattered ultrasonic guided wavefield data with high spatial resolution. The direct path waves were extracted to obtain the incident wavefield while the scattered signals were used to calculate the scattering wave field. Damage imaging can also be achieved by introducing crosscorrelation imaging condition. Imaging results show that the method is very effective for crack localization and boundary shape-recognition. Numerical simulation results and imaging algorithm laid the foundation for the method applied in experiment and practice.

Paper Details

Date Published: 12 May 2017
PDF: 6 pages
Proc. SPIE 10173, Fourth International Symposium on Laser Interaction with Matter, 1017317 (12 May 2017); doi: 10.1117/12.2268355
Show Author Affiliations
C. G. Xu, Jiangsu Univ. (China)
B. Q. Xu, Jiangsu Univ. (China)
Y. Luo, Jiangsu Univ. (China)
G. D. Xu, Jiangsu Univ. (China)
L. Z. Lu, Jiangsu Univ. (China)


Published in SPIE Proceedings Vol. 10173:
Fourth International Symposium on Laser Interaction with Matter
Yongkun Ding; Guobin Feng; Dieter H. H. Hoffmann; Jianlin Cao; Yongfeng Lu, Editor(s)

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