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Non-uniformity calibration for MWIR polarization imagery obtained with integrated microgrid polarimeters
Author(s): Hai-Zheng Liu; Ze-Lin Shi; Bin Feng; Bin Hui; Yao-Hong Zhao
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Paper Abstract

Integrating microgrid polarimeters on focal plane array (FPA) of an infrared detector causes non-uniformity of polarization response. In order to reduce the effect of polarization non-uniformity, this paper constructs an experimental setup for capturing raw flat-field images and proposes a procedure for acquiring non-uniform calibration (NUC) matrix and calibrating raw polarization images. The proposed procedure takes the incident radiation as a polarization vector and offers a calibration matrix for each pixel. Both our matrix calibration and two-point calibration are applied to our mid-wavelength infrared (MWIR) polarization imaging system with integrated microgrid polarimeters. Compared with two point calibration, our matrix calibration reduces non-uniformity by 30~40% under condition of flat-field data test with polarization. The ourdoor scene observation experiment indicates that our calibration can effectively reduce polarization non-uniformity and improve the image quality of our MWIR polarization imaging system.

Paper Details

Date Published: 8 March 2017
PDF: 6 pages
Proc. SPIE 10255, Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016, 102554D (8 March 2017); doi: 10.1117/12.2268322
Show Author Affiliations
Hai-Zheng Liu, Shenyang Institute of Automation (China)
Key Lab. of Optical-Electronics Information Processing (China)
Univ. of Chinese Academy of Sciences (China)
Ze-Lin Shi, Shenyang Institute of Automation (China)
Key Lab. of Optical-Electronics Information Processing (China)
Bin Feng, Shenyang Institute of Automation (China)
Key Lab. of Optical-Electronics Information Processing (China)
Xi'an Technological Univ. (China)
Bin Hui, Shenyang Institute of Automation (China)
Key Lab. of Optical-Electronics Information Processing (China)
Yao-Hong Zhao, Shenyang Institute of Automation (China)
Key Lab. of Optical-Electronics Information Processing (China)


Published in SPIE Proceedings Vol. 10255:
Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016
Yueguang Lv; Jialing Le; Hesheng Chen; Jianyu Wang; Jianda Shao, Editor(s)

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