Share Email Print
cover

Proceedings Paper

Flatness metrology based on small-angle deflectometric procedures with electronic tiltmeters
Author(s): G. Ehret; S. Laubach; M. Schulz
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The measurement of optical flats, e. g. synchrotron or XFEL mirrors, with single nanometer topography uncertainty is still challenging. At PTB, we apply for this task small-angle deflectometry in which the angle between the direction of the beam sent to the surface and the beam detected is small. Conventional deflectometric systems measure the surface angle with autocollimators whose light beam also represents the straightness reference. An advanced flatness metrology system was recently implemented at PTB that separates the straightness reference task from the angle detection task. We call it ‘Exact Autocollimation Deflectometric Scanning’ because the specimen is slightly tilted in such a way that at every scanning position the specimen is ‘exactly’ perpendicular to the reference light beam directed by a pentaprism to the surface under test. The tilt angle of the surface is then measured with an additional autocollimator. The advantage of the EADS method is that the two tasks (straightness reference and measurement of surface slope) are separated and each of these can be optimized independently. The idea presented in this paper is to replace this additional autocollimator by one or more electro-mechanical tiltmeters, which are typically faster and have a higher resolution than highly accurate commercially available autocollimators. We investigate the point stability and the linearity of a highly accurate electronic tiltmeter. The pros and cons of using tiltmeters in flatness metrology are discussed.

Paper Details

Date Published: 15 June 2017
PDF: 6 pages
Proc. SPIE 10326, Fourth European Seminar on Precision Optics Manufacturing, 1032604 (15 June 2017); doi: 10.1117/12.2268288
Show Author Affiliations
G. Ehret, Physikalisch-Technische Bundesanstalt (Germany)
S. Laubach, Physikalisch-Technische Bundesanstalt (Germany)
M. Schulz, Physikalisch-Technische Bundesanstalt (Germany)


Published in SPIE Proceedings Vol. 10326:
Fourth European Seminar on Precision Optics Manufacturing
Oliver W. Fähnle; Rolf Rascher; Christine Wünsche, Editor(s)

© SPIE. Terms of Use
Back to Top