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Gas monitoring onboard ISS using FTIR spectroscopy
Author(s): Michael Gisi; Armin Stettner; Roland Seurig; Atle Honne; Johannes Witt; Pierre Rebeyre
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Paper Abstract

In the confined, enclosed environment of a spacecraft, the air quality must be monitored continuously in order to safeguard the crew's health. For this reason, OHB builds the ANITA2 (Analysing Interferometer for Ambient Air) technology demonstrator for trace gas monitoring onboard the International Space Station (ISS). The measurement principle of ANITA2 is based on the Fourier Transform Infrared (FTIR) technology with dedicated gas analysis software from the Norwegian partner SINTEF. This combination proved to provide high sensitivity, accuracy and precision for parallel measurements of 33 trace gases simultaneously onboard ISS by the precursor instrument ANITA1. The paper gives a technical overview about the opto-mechanical components of ANITA2, such as the interferometer, the reference Laser, the infrared source and the gas cell design and a quick overview about the gas analysis. ANITA2 is very well suited for measuring gas concentrations specifically but not limited to usage onboard spacecraft, as no consumables are required and measurements are performed autonomously. ANITA2 is a programme under the contract of the European Space Agency, and the air quality monitoring system is a stepping stone into the future, as a precursor system for manned exploration missions.

Paper Details

Date Published: 26 June 2017
PDF: 12 pages
Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103292R (26 June 2017); doi: 10.1117/12.2268146
Show Author Affiliations
Michael Gisi, OHB-System AG (Germany)
Armin Stettner, OHB-System AG (Germany)
Roland Seurig, OHB-System AG (Germany)
Atle Honne, SINTEF (Norway)
Johannes Witt, European Space Research and Technology Ctr. (Netherlands)
Pierre Rebeyre, European Space Research and Technology Ctr. (Netherlands)


Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves, Editor(s)

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